Title |
Secondary ion mass spectrometry : fundamentals and applications ; report on the Japan-United States Joint Seminar on SIMS / Japan Society for the Promotion of Science ; National Science Foundation |
|---|---|
Involved |
Japan United States Joint Seminar on SIMS (Herausgebendes Organ) |
Published |
Tokyo: [Verlag nicht ermittelbar] |
Publication history |
Nachgewiesen 2.1978(1979) - |
Country |
|
Topic |
|
Subject |
Sekundärionen-Massenspektrometrie, Kongress |
Record ID |
011667583 |
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