Title |
Test set compaction and diagnosis of crosstalk faults / Shehzad Hasan |
|---|---|
Involved |
Shehzad Hasan (Verfasser) |
Published |
Aachen: Shaker |
Extent |
X, 182 S. : graph. Darst. |
Thesis |
Zugl.: Bremen, Univ., Diss., 2010 |
ISBN |
978-3-8322-9433-5 |
Language |
|
Country |
|
Topic |
|
Subject |
VLSI, System-on-Chip, Nanometerbereich, Nebensprechen, Übertragungsfehler, Fehlerortung, Testmustergenerierung, Fehlererkennung, Fehlersimulation |
DDC notation |
|
Series |
Berichte aus der Elektrotechnik |
Other editions |
Erscheint auch als Online-Ausgabe: Test Set Compaction and Diagnosis of Crosstalk Faults |
Record ID |
1007492279 |
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