Title |
Single ion impact detection & scanning probe aligned ion implantation for quantum bit formation / Christoph D. Weis. Gutachter: Gerhard Gobsch ; Thomas Schenkel. Betreuer: Ivo W. Rangelow |
|---|---|
Involved |
Christoph Weis (Verfasser) |
Published |
Ilmenau: Universitätsbibliothek Ilmenau |
Extent |
Online-Ressource |
Thesis |
Ilmenau, Technische Universität Ilmenau, Diss., 2012 |
Language |
|
Country |
|
Topic |
|
Subject |
single ion implantation - single ion impact detection - scanning probe aligned ion beams - quantum bit formation - nitrogen-vacany centers quantum computing silicon diamond metal ion source deterministic doping |
DDC notation |
|
Other editions |
Erscheint auch als Druck-Ausgabe: Single ion impact detection & scanning probe aligned ion implantation for quantum bit formation |
Persistent identifier |
|
Record ID |
1024884732 |
Please note
The beta version does not yet contain all functions and information of the DNB portal catalogue. If you are missing information or want to order a medium, please visit the page in the DNB portal catalogue via the following link: