Title |
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll |
|---|---|
Involved |
Guntrade Roll (Verfasser) |
Published |
Berlin: Logos-Verl. |
Extent |
159, LXXI S. : Ill., graph. Darst. |
Thesis |
Zugl.: Erlangen, Nürnberg, Univ., Diss., 2012 |
ISBN |
978-3-8325-3261-1 |
Language |
|
Country |
|
Topic |
|
Subject |
MOS-FET, Leckstrom, Gitterbaufehler, p-Kanal-FET, High-k-Dielektrikum, Gate-Oxid, Source (Elektronik), Drain (Elektronik), Elektrische Messtechnik, Simulation |
DDC notation |
|
Series |
Research at NaMLab ; Bd. 2 |
Record ID |
1027588948 |
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