Title |
Reliability of high-k/metal gate field-effect transistors considering circuit operational constraints / Steve Kupke |
|---|---|
Involved |
Steve Kupke (Verfasser) |
Published |
Norderstedt: BoD - Books on Demand |
Edition |
[1. Auflage] |
Extent |
118 Seiten : Illustrationen |
Thesis |
Dissertation, Technische Universität Dresden, 2015 |
ISBN |
978-3-7412-0869-0 |
Language |
|
Country |
|
Topic |
|
Subject |
High-k Metal-Gate-Technik, Hafniumdioxid, High-k-Dielektrikum, MOS-FET, Statisches RAM, Schaltvorgang, Degradation (Technik), Schwellenspannung, Durchschlagspannung, Zuverlässigkeit |
DDC notation |
|
Series |
Research at NaMLab |
Other editions |
Erscheint auch als Online-Ausgabe: Reliability of high-k/metal gate field-effect transistors considering circuit operational constraints |
Record ID |
1102947784 |
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