Title |
Reliability of high-k/metal gate field-effect transistors considering circuit operational constraints / Steve Kupke |
|---|---|
Involved |
Steve Kupke (Verfasser) |
Published |
Norderstedt: Books on Demand |
Extent |
Online-Ressource |
ISBN |
978-3-7412-0869-0 |
Language |
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Country |
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Topic |
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Subject |
High-k Metal-Gate-Technik, Hafniumdioxid, High-k-Dielektrikum, MOS-FET, Statisches RAM, Schaltvorgang, Degradation (Technik), Schwellenspannung, Durchschlagspannung, Zuverlässigkeit |
DDC notation |
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Other editions |
Erscheint auch als Druck-Ausgabe: Reliability of high-k/metal gate field-effect transistors considering circuit operational constraints |
Persistent identifier |
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Further information |
Lizenzpflichtig. - Vom Verlag als Druckwerk on demand und/oder als E-Book angeboten |
Record ID |
1103086499 |
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