Title |
Characterization of atomic transport in nano-structured silicon and germanium to reveal properties of self- and foreign-atom defects / vorgelegt von Tobias Südkamp aus Dinklage |
|---|---|
Involved |
Tobias Südkamp (Verfasser) |
Published |
Münster |
Extent |
159 Seiten : Illustrationen |
Thesis |
Dissertation, Westfälische Wilhelms-Universität Münster, 2018, Nicht für den Austausch |
Language |
|
Country |
|
Topic |
|
Subject |
Silicium, Germanium, Nanostruktur, Störstelle, Selbstdiffusion, Fremddiffusion |
Record ID |
1161490701 |
Please note
The beta version does not yet contain all functions and information of the DNB portal catalogue. If you are missing information or want to order a medium, please visit the page in the DNB portal catalogue via the following link: