Title |
Charakterisierung von Sc(x)Al(1-x)N-Schichten für die Anwendung in der Magnetfeldsensorik / Tim Hofmann ; Gutachter: Jörg Pezoldt ; Betreuer: Stefan Krischok |
|---|---|
Involved |
Tim Hofmann (Verfasser) |
Published |
Ilmenau: ilmedia |
Extent |
Online-Ressource |
Thesis |
Bachelorarbeit, Ilmenau, ilmedia |
Language |
|
Country |
|
Topic |
|
Persistent identifier |
urn:nbn:de:gbv:ilm1-2019200209 (URN) |
Record ID |
1184797250 |
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