Title |
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations |
|---|---|
Involved |
Baptiste Gault (Verfasser)
Andrew J. Breen (Verfasser) Yanhong Chang (Verfasser) Junyang He (Verfasser)
Eric A. Jägle (Verfasser)
Paraskevas Kontis (Verfasser) Philipp Kürnsteiner (Verfasser) Alisson Kwiatkowski da Silva (Verfasser) Surendra Kumar Makineni (Verfasser) Isabelle Mouton (Verfasser) Zirong Peng (Verfasser) Dirk Ponge (Verfasser) Torsten Schwarz (Verfasser) Leigh T. Stephenson (Verfasser) Agnieszka Szczepaniak (Verfasser) Huan Zhao (Verfasser) Dierk Raabe (Verfasser) SpringerLink (Online service) (Sonstige) |
Published in |
Journal of materials research : JMR 33, 23, 1.12.2018, date:12.2018, Seite 4018-4030 |
Published |
2018 |
Language |
|
Country |
|
Topic |
|
Subject |
Materials Science, general.
Biomaterials. Nanotechnology. Inorganic Chemistry.
Materials Engineering.
Applied and Technical Physics. |
DDC notation |
|
Persistent identifier |
urn:nbn:de:101:1-2020112918150547297975 (URN) |
Record ID |
1222419947 |
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