Title |
Application of Spectroscopic Ellipsometry and Infrared Spectroscopy for the Real-Time Control and Characterization of a-Si:H Growth in a-Si:H/c-Si Heterojunction Solar Cells |
|---|---|
Involved |
Hiroyuki Fujiwara (Verfasser) |
Published in |
MRS online proceedings library 862, 1, 10.12.2020, date:12.2004, Seite 1411-14111 |
Published |
2005 |
Language |
|
Country |
|
Topic |
|
Subject |
Materials Science, general.
Characterization and Evaluation of Materials. Nanotechnology. Inorganic Chemistry.
Materials Engineering.
Applied and Technical Physics. |
DDC notation |
|
Persistent identifier |
urn:nbn:de:101:1-2021040311144390599223 (URN) |
Record ID |
1230680586 |
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