Title |
Ultrasensitive Strain Sensors Based on Cu‐Al Alloy Films with Voided Cluster Boundaries |
|---|---|
Involved |
Xuping Wu (Verfasser)
Honglei Chen (Verfasser) Xuemei Luo (Verfasser) Dong Wang (Verfasser)
Peter Schaaf (Verfasser)
Guangping Zhang (Verfasser) |
Published in |
Advanced Materials Technologies 10.08.2021 |
Published |
10.08.2021 |
Language |
|
Country |
|
Subject |
channel cracks |
Persistent identifier |
urn:nbn:de:101:1-2021081115050395510617 (URN) |
Record ID |
1238736254 |
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