Title |
Volatility and Dependence Models with Applications to U.S. Equity Markets / Jingwei Pan ; Jens Krüger, Dirk Schiereck |
|---|---|
Involved |
Jingwei Pan (Verfasser) |
Published |
Darmstadt: Universitäts- und Landesbibliothek |
Extent |
Online-Ressource |
Thesis |
Dissertation, Darmstadt, Technische Universität Darmstadt, 2021 |
Language |
|
Country |
|
Topic |
|
Persistent identifier |
urn:nbn:de:tuda-tuprints-200522 (URN) |
Record ID |
1249507200 |
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