Title |
The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening / Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul-Ho Lee, Lain-Jong Li, Xiaomin Xu, Vincent Tung, Emil J.W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, Norbert Koch |
|---|---|
Involved |
Soohyung Park (Verfasser)
Thorsten Schultz (Verfasser) Dongguen Shin (Verfasser) Niklas Mutz (Verfasser)
Areej Aljarb (Verfasser)
Hee Seong Kang (Verfasser) Chul-Ho Lee (Verfasser) Lain-Jong Li (Verfasser) Xiaomin Xu (Verfasser) Vincent Tung (Verfasser) Emil List-Kratochvil (Verfasser) Sylke Blumstengel (Verfasser) Patrick Amsalem (Verfasser) Norbert Koch (Verfasser) |
Published |
Berlin: Humboldt-Universität zu Berlin |
Extent |
Online-Ressource |
Language |
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Country |
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Topic |
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Subject |
MoS2 monolayer
2D semiconductors ionization energy electron affinity
photoelectron spectroscopy
Fermi level pinning |
DDC notation |
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Persistent identifier |
urn:nbn:de:kobv:11-110-18452/25236-1 (URN) |
Further information |
In: ACS nano, Band 15, Ausgabe 9, Seite 14794-14803, 2021 |
Record ID |
1256673676 |
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