Title |
A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells / Marko Andjelkovic ; Gutachter: Milos Krstic, Harald Michalik, Michael Gössel ; Milos Krstic, Mario Schölzel, Ulrike Lucke |
|---|---|
Involved |
Marko Andjelković (Verfasser)
Miloš Krstić (Akademischer Betreuer) Mario Schölzel (Akademischer Betreuer) Ulrike Lucke (Akademischer Betreuer) |
Published |
Potsdam: Universität Potsdam |
Extent |
Online-Ressource |
Thesis |
Dissertation, Potsdam, Universität Potsdam, 2021 |
Language |
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Country |
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Topic |
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Subject |
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DDC notation |
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Persistent identifier |
urn:nbn:de:kobv:517-opus4-534843 (URN) |
Record ID |
1265014183 |
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