Title |
Electron beam effects on oxide thin films - structure and electrical property correlations |
|---|---|
Involved |
Krishna Kanth Neelisetty (Verfasser)
Xiaoke Mu (Verfasser) Sebastian Gutsch (Verfasser) Alexander Vahl (Verfasser)
Alan Molinari (Verfasser)
Falk Von Seggern (Verfasser) Mirko Hansen (Verfasser) Torsten Scherer (Verfasser) Margit Zacharias (Verfasser) Lorenz Kienle (Verfasser) Venkata Sai Kiran Chakravadhanula (Verfasser) Christian Kübel (Verfasser) Albert-Ludwigs-Universität Freiburg. Professur für Nanotechnologie (Mitwirkender) |
Published |
Freiburg: Universität |
Extent |
Online-Ressource |
Language |
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Country |
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Topic |
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Subject |
Instrumentation |
DDC notation |
|
Persistent identifier |
urn:nbn:de:bsz:25-freidok-1538015 (URN) |
Further information |
Microscopy and microanalysis. - 25, 3 (2019) , 592-600, ISSN: 1431-9276 |
Record ID |
1273978552 |
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