Title |
A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry : An Application Example in Lithium Batteries Research / Luca Cressa, Jonas Fell, Christoph Pauly, Quang Hung Hoang, Frank Mücklich, Hans-Georg Herrmann, Tom Wirtz, Santhana Eswara |
|---|---|
Involved |
Luca Cressa (Verfasser)
Jonas Fell (Verfasser) Christoph Pauly (Verfasser) Quang Hung Hoang (Verfasser)
Frank Mücklich (Verfasser)
Hans-Georg Herrmann (Verfasser) Tom Wirtz (Verfasser) Santhana Eswara (Verfasser) |
Published |
Saarbrücken: Saarländische Universitäts- und Landesbibliothek |
Extent |
Online-Ressource |
Language |
|
Country |
|
Topic |
|
Subject |
battery material
composite cathode correlative microscopy elemental mapping
nanoCT
SIMS SEM |
DDC notation |
|
Persistent identifier |
urn:nbn:de:bsz:291--ds-382351 (URN) |
Further information |
In: Microscopy and Microanalysis. - 28 : Cambridge University Press, 2022, 6, 1890 - 1895 |
Record ID |
127407715X |
Please note
The beta version does not yet contain all functions and information of the DNB portal catalogue. If you are missing information or want to order a medium, please visit the page in the DNB portal catalogue via the following link: