Title |
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films |
|---|---|
Involved |
Anna Behler (Verfasser)
Niclas Teichert (Verfasser) Biswanath Dutta (Verfasser) Anja Waske (Verfasser)
Tilmann Hickel (Verfasser)
Alexander Auge (Verfasser) Andreas Hütten (Verfasser) Jürgen Eckert (Verfasser) |
Published |
New York : American Institute of Physics |
Extent |
Online-Ressource |
Language |
|
Country |
|
Topic |
|
Subject |
Magnetic hysteresis
Atomic force microscopy Martensitic phase transitions Nickel
Exchange interactions
Coercive force Thin film structure Antiferromagnetism Magnetic fields |
Persistent identifier |
10.34657/4895 (DOI) |
Further information |
In: AIP Advances, Volume 3, Issue 12 |
Record ID |
1280274239 |
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