Title |
Challenges for drift-diffusion simulations of semiconductors: A comparative study of different discretization philosophies |
|---|---|
Involved |
Patricio Farrell (Verfasser) |
Published |
Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik |
Extent |
Online-Ressource |
Language |
|
Country |
|
Subject |
Finite volume method
finite element method finite difference method comparison
benchmark
flux discretization Scharfetter-Gummel scheme semiconductors van Roosbroeck system device simulation nonlinear diffusion diffusion enhancement |
Persistent identifier |
10.34657/2116 (DOI) |
Further information |
In: Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik , Volume 2486, ISSN 2198-5855 |
Record ID |
128031320X |
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