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Yue Chen, Markus Schilling, Philipp von Hartrott et al.

Ontopanel: A Tool for Domain Experts Facilitating Visual Ontology Development and Mapping for FAIR Data Sharing in Materials Testing

Published in: Integrating materials and manufacturing innovation 11, 4, 17.10.2022, date:12.2022

Title

Ontopanel: A Tool for Domain Experts Facilitating Visual Ontology Development and Mapping for FAIR Data Sharing in Materials Testing

Involved 
Yue Chen (Verfasser)
Markus Schilling (Verfasser)
Philipp von Hartrott (Verfasser)
Hossein Beygi Nasrabadi (Verfasser)
Birgit Skrotzki (Verfasser)
Jürgen Olbricht (Verfasser)
SpringerLink (Online service) (Sonstige)

Published in

Integrating materials and manufacturing innovation 11, 4, 17.10.2022, date:12.2022, Seite 545-556

Published

2022

Language

Englisch

Country

Deutschland

Topic

Informatik

Subject

Metallic Materials.
Characterization and Evaluation of Materials.
Structural Materials.
Surfaces and Interfaces, Thin Films.
Nanotechnology.

DDC notation

006.33

Persistent identifier

urn:nbn:de:101:1-2023022121261373609551 (URN)
10.1007/s40192-022-00279-y (DOI)

Record ID

1281594520
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