Title |
Charge Trapping at the Dielectric of Organic Transistors Visualized in Real Time and Space † |
---|---|
Involved |
S. G. J. Mathijssen (Verfasser)
Martijn Kemerink (Verfasser) Abhinav Sharma (Verfasser) Michael Cölle (Verfasser)
P. A. Bobbert (Verfasser)
R. A. J. Janssen (Verfasser) D. M. de Leeuw (Verfasser) |
Published in |
Advanced materials 20, 5, 2008, Seite 975-979 |
Published |
12.02.2008 |
Language |
|
Country |
|
Subject |
Atomic force microscopy |
Persistent identifier |
urn:nbn:de:101:1-2023062305304260167108 (URN) |
Record ID |
1293614815 |
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