Title |
Active Probe Atomic Force Microscopy : A Practical Guide on Precision Instrumentation / by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
|---|---|
Involved |
Fangzhou Xia (Verfasser) |
Published |
Cham: Springer International Publishing, Imprint: Springer |
Edition |
1st ed. 2024 |
Extent |
Online-Ressource, XXIV, 366 p. 138 illus., 125 illus. in color. : online resource. |
Contains |
Introduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix |
ISBN |
978-3-031-44233-9 |
Language |
|
Country |
|
Topic |
|
Subject |
Measurement Science and Instrumentation. |
DDC notation |
|
Persistent identifier |
urn:nbn:de:101:1-2024020703082010780048 (URN) |
Record ID |
1318513618 |
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