Title |
Pattern Recognition : Introduction, Features, Classifiers and Principles / Jürgen Beyerer, Raphael Hagmanns, Daniel Stadler |
|---|---|
Involved |
Jürgen Beyerer (Verfasser) |
Published |
Berlin/München/Boston: De Gruyter Oldenbourg |
Edition |
2nd edition |
Extent |
1 Online-Ressource, 21, 327 Seiten : 17 Illustrationen, 140 Illustrationen |
ISBN |
978-3-11-133920-7 |
Language |
|
Country |
|
Topic |
Informatik |
Subject |
Mustererkennung, Merkmalsextraktion, Automatische Klassifikation |
DDC notation |
|
Series |
De Gruyter Textbook |
Other editions |
Erscheint auch als Druck-Ausgabe: Pattern recognition : introduction, features, classifiers and principles |
Persistent identifier |
urn:nbn:de:101:1-2024031916034149843603 (URN) |
Record ID |
1323924906 |
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