Title |
X-ray and image analysis in electron microscopy / John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) |
|---|---|
Involved |
John J. Friel (Verfasser) |
Published |
Berlin: Bruker Nano GmbH |
Edition |
3rd edition |
Extent |
118 Seiten : Illustrationen + 1 Poster |
ISBN |
978-3-00-053537-6 |
Language |
|
Country |
|
Topic |
|
Subject |
|
DDC notation |
|
Record ID |
1347518878 |
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