Title |
Towards an EPR on a Chip Spectrometer for Monitoring Radiation Damage During X-ray Absorption Spectroscopy |
|---|---|
Involved |
Ekaterina Shabratova (Verfasser)
Hadi Lotfi (Verfasser) Ayman Sakr (Verfasser) Mohamed Hassan (Verfasser)
Michal Kern (Verfasser)
Matthias Neeb (Verfasser) René Grüneberger (Verfasser) Bastian Klemke (Verfasser) Gianluca Marcozzi (Verfasser) Klaus Kiefer (Verfasser) Aleksei Tsarapkin (Verfasser) Katja Höflich (Verfasser) Alina Dittwald (Verfasser) Andrea Denker (Verfasser) Jens Anders (Verfasser) Joseph E. McPeak (Verfasser) Klaus Lips (Verfasser) SpringerLink (Online service) (Sonstige) |
Published in |
Applied magnetic resonance : AMR 3.9.2024, Seite 1-21 |
Published |
2024 |
Language |
|
Country |
|
Topic |
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Subject |
Condensed Matter Physics. |
Persistent identifier |
urn:nbn:de:101:1-2411261052053.619262828111 (URN) |
Record ID |
1349362166 |
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