Title |
Characterization and correction of multilayer X-ray optics / Jan Lukas Dresselhaus ; Betreuer: Saša Bajt |
|---|---|
Involved |
Jan Lukas Dresselhaus (Verfasser) |
Published |
Hamburg: Staats- und Universitätsbibliothek Hamburg Carl von Ossietzky |
Extent |
Online-Ressource |
Thesis |
Dissertation, Hamburg, Universität Hamburg, 2025 |
Language |
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Country |
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Topic |
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Subject |
Mehrschichtsystem |
DDC notation |
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Persistent identifier |
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Record ID |
1359678697 |
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