Title |
Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages |
|---|---|
Involved |
Brian K. Tanner (Verfasser) |
Published |
Freiburg: Universität |
Extent |
Online-Ressource |
Language |
|
Country |
|
Topic |
|
DDC notation |
|
Persistent identifier |
urn:nbn:de:bsz:25-freidok-1378958 (URN) |
Further information |
Journal of applied crystallography. - 50, 2 (2017) , 547-554, ISSN: 1600-5767 |
Record ID |
1360198679 |
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