Title |
Elemental Analysis : ICP-MS, ICP-OES, AAS, XRF / Frank Vanhaecke, José Luis Todolí, Gerhard Schlemmer, Michael W. Hinds |
|---|---|
Involved |
Frank Van Haecke (Verfasser) |
Published |
Berlin/Boston: De Gruyter |
Edition |
2nd, Completely Revised and Extended Edition |
Extent |
Online-Ressource, 10, 460 Seiten : 66 Illustrationen, 148 Illustrationen |
ISBN |
978-3-11-133394-6 |
Language |
|
Country |
|
Topic |
|
Subject |
|
DDC notation |
|
Series |
De Gruyter Textbook |
Other editions |
Erscheint auch als Druck-Ausgabe: Elemental Analysis : ICP-MS, ICP-OES, AAS, XRF |
Persistent identifier |
urn:nbn:de:101:1-2506200956404.167448593584 (URN) |
Record ID |
1369200528 |
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