Title |
Fabrication of focused ion beam-deposited nanowire probes for conductive atomic force microscopy / Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo W. Rangelow, Teodor Gotszalk |
|---|---|
Involved |
Ewelina Gacka (Verfasser)
Bartosz Pruchnik (Verfasser) Magdalena Tamulewicz-Szwajkowska (Verfasser) Dominik Badura (Verfasser)
Ivo W. Rangelow (Verfasser)
Teodor Gotszalk (Verfasser) |
Published |
Ilmenau: TU Ilmenau |
Extent |
Online-Ressource, 7 Seiten |
Language |
|
Country |
|
Topic |
|
Subject |
C-AFM
FIBID Nanowire probes Postprocessing steps
SPM
Usability tests |
DDC notation |
|
Persistent identifier |
urn:nbn:de:101:1-2511030208005.296836555782 (URN) |
Further information |
In: Measurement(234) - ISSN 1873-412X |
Record ID |
1380560411 |
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