Title |
Distribution analysis in xCT data for identifying factors influencing uncertainty of repeated measurements |
|---|---|
Involved |
Lionel Kielhöfer (Verfasser) |
Published in |
E-Journal of nondestructive testing 30, 8, 2025 |
Published |
08.2025 |
Language |
|
Country |
|
Persistent identifier |
urn:nbn:de:101:1-2603201924421.697432786718 (URN) |
Record ID |
1393545688 |
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