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Stanford University

Secondary ion mass spectrometry : fundamentals and applications ; report on the Japan-United States Joint Seminar on SIMS

2.

Tokyo: [Verlag nicht ermittelbar], 1979

Title

Secondary ion mass spectrometry : fundamentals and applications ; report on the Japan-United States Joint Seminar on SIMS. 2. / Stanford Univ., Stanford, California, USA, August 17 - 31, 1979

Involved 

Stanford University (Herausgebendes Organ)

Published

Tokyo: [Verlag nicht ermittelbar]
1979

Extent

XIII, 298 S. : 234 Ill. u. graph. Darst.

ISBN

978-3-540-09843-0
978-0-387-09843-2

Country

Japan

Topic

Astronomie, Kartografie
Physik

Subject

Massenspektrometrie

Series

Springer series in chemical physics ; Vol. 9

Part of

Secondary ion mass spectrometry : fundamentals and applications ; report on the Japan-United States Joint Seminar on SIMS

Record ID

820785210
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