Title |
Charakterisierung von Mikropinchen mittels SXR- und XUV-Diagnostik am Plasmafokus SPEED-2 / vorgelegt von Peter Röwekamp |
|---|---|
Involved |
Peter Röwekamp (Verfasser) |
Published |
1996 |
Extent |
89 S. : Ill., graph. Darst. |
Thesis |
Düsseldorf, Univ., Diss., 1996 |
Topic |
|
Subject |
Argon, Plasma, Pinch, Röntgenspektroskopie, Emissionsspektroskopie, Vakuumultraviolett |
Record ID |
947604200 |
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