Title |
Defektverhalten in amorphem, hydrogenisiertem Silicium, dargestellt mit der Wasserstoffabstraktionsmethode / vorgelegt von Markus Lenski |
|---|---|
Involved |
Markus Lenski (Verfasser) |
Published |
1996 |
Edition |
[Mikrofiche-Ausg.] |
Extent |
Bl. : Ill., graph. Darst. |
Thesis |
Frankfurt (Main), Univ., Diss., 1996 |
Topic |
|
Subject |
Silicium, Amorpher Zustand, Wasserstoff, Gitterbaufehler, Deprotonierung |
Further information |
Mikrofiche-Ausg.: 3 Mikrofiches : 24x |
Record ID |
951507494 |
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