Title |
High resolution X-ray scattering from thin films and multilayers / Václav Holý ; Ullrich Pietsch ; Tilo Baumbach |
|---|---|
Involved |
Václav Holý (Verfasser) |
Published |
Berlin, Heidelberg, New York, Barcelona, Hong Kong, London, Milan, Paris, Singapore, Tokyo: Springer |
Extent |
XI, 256 S. : graph. Darst. |
ISBN |
978-3-540-62029-7 |
Language |
|
Topic |
|
Subject |
Dünne Schicht, Röntgenstreuung |
Series |
Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften ; Vol. 149 |
Former / later titles |
Fortsetzung: High resolution X-ray scattering from thin films to lateral nanostructures |
Further information |
Literaturangaben |
Record ID |
954682696 |
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