Title |
Röntgenographische Untersuchungen von Si1-xGex-Stranski-Krastanow-Inseln auf Silizium (001) / von Thomas Wiebach |
|---|---|
Involved |
Thomas Wiebach (Verfasser) |
Published |
2000 |
Extent |
85 Bl. : Ill., graph. Darst. |
Thesis |
Berlin, Humboldt-Univ., Diss., 2000 |
Language |
|
Topic |
|
Subject |
Silicium, Germanium, Mischkristall, Flüssigphasenepitaxie, Inselschicht, Röntgenographie |
Record ID |
959665196 |
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