Title |
Charakterisierung von Leerstelleneigenschaften in Silicium und Germanium mittels der interstitiell-substitutionellen Fremddiffusion / vorgelegt von Axel Giese |
|---|---|
Involved |
Axel Giese (Verfasser) |
Published |
2000 |
Extent |
198 S. : graph. Darst. |
Thesis |
Münster (Westfalen), Univ., Diss., 2000 (Nicht für den Austausch) |
Language |
|
Topic |
|
Subject |
Silicium, Gitterleerstelle, Fremdatom, Zink, Diffusion |
Record ID |
959929800 |
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