Title |
Application of molecular primary ions for time-of-flight secondary ion mass spectrometry (TOF-SIMS) of organic surfaces / vorgelegt von Dietmar Stapel |
|---|---|
Involved |
Dietmar Stapel (Verfasser) |
Published |
2000 |
Extent |
85 S. : graph. Darst. |
Thesis |
Münster (Westfalen), Univ., 2000 (Nicht für den Austausch) |
Language |
|
Topic |
|
Subject |
Langmuir-Blodgett-Film, Sekundärionen-Massenspektrometrie, Flugzeitspektrometrie |
Record ID |
960993983 |
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