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Yuri I. Ingster and Irina A. Suslina

Nonparametric goodness of fit testing under Gaussian models

New York, Berlin, Heidelberg, Hong Kong, London, Milan, Paris, Tokyo: Springer, 2003

Title

Nonparametric goodness of fit testing under Gaussian models / Yu. I. Ingster ; I. A. Suslina

Involved 

Yuri I. Ingster (Verfasser)
Irina A. Suslina (Verfasser)

Published

New York, Berlin, Heidelberg, Hong Kong, London, Milan, Paris, Tokyo: Springer
2003

Extent

XIV, 452 S. : graph. Darst.

ISBN

0-387-95531-3

Language

Englisch

Topic

Mathematik

Subject

Güte der Anpassung, Nichtparametrischer Test

Series

Lecture notes in statistics : a series ; 169

Other editions

Erscheint auch als Online-Ausgabe: Nonparametric Goodness-of-Fit Testing Under Gaussian Models

Further information

Literaturverz. S. 444 - 449

Record ID

965795489
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