Title |
Züchtung und Charakterisierung von versetzungsarmen Silizium-dotierten GaAs-Substratkristallen / vorgelegt von Bernhard Birkmann |
|---|---|
Involved |
Bernhard Birkmann (Verfasser) |
Published |
2002 |
Extent |
167 S. : Ill., graph. Darst. |
Thesis |
Erlangen, Nürnberg, Univ., Diss., 2003 |
Topic |
|
Subject |
Galliumarsenid, Silicium, Dotierung, Versetzung (Kristallographie), Bridgman-Verfahren |
Record ID |
967283868 |
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