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Ullrich Pietsch, Václav Holý and Tilo Baumbach

High resolution X-ray scattering from thin films to lateral nanostructures

2. ed.

New York, Berlin, Heidelberg, Hong Kong, London, Milan, Paris, Tokyo: Springer, 2004

Title

High resolution X-ray scattering from thin films to lateral nanostructures / Ullrich Pietsch ; Václav Holý ; Tilo Baumbach

Involved 

Ullrich Pietsch (Verfasser)
Václav Holý (Verfasser)
Tilo Baumbach (Verfasser)

Published

New York, Berlin, Heidelberg, Hong Kong, London, Milan, Paris, Tokyo: Springer
2004

Edition

2. ed.

Extent

XVI, 408 S. : graph. Darst.

ISBN

0-387-40092-3

Language

Englisch

Topic

Physik

Subject

Dünne Schicht, Röntgenstreuung
Mehrschichtsystem, Röntgenstreuung

Series

Advanced texts in physics
Physics and astronomy online library

Former / later titles

Vorgänger: High resolution X-ray scattering from thin films and multilayers

Further information

Literaturverz. S. 389 - 402

Record ID

968583652
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