Title |
Methodology for electrical characterization of MOS devices with alternative gate dielectrics / von Andreas Kerber |
|---|---|
Involved |
Andreas Kerber (Verfasser) |
Published |
2004 |
Extent |
Online-Ressource |
Thesis |
Darmstadt, Techn. Univ., Diss., 2004 |
Language |
|
Topic |
|
Subject |
CMOS, Gate-Oxid, Aluminiumoxide, Dielektrizitätszahl, Ladungsträgerbeweglichkeit, Rekombination |
Other editions |
Erscheint auch als Druck-Ausgabe: Methodology for electrical characterization of MOS devices with alternative gate dielectrics |
Persistent identifier |
|
Further information |
Dateien im PDF-Format |
Record ID |
970133812 |
Please note
The beta version does not yet contain all functions and information of the DNB portal catalogue. If you are missing information or want to order a medium, please visit the page in the DNB portal catalogue via the following link: