Title |
Thin film analysis by x-ray scattering / Mario Birkholz. With contributions by Paul F. Fewster ; Christoph Genzel |
|---|---|
Involved |
Mario Birkholz (Mitwirkender) |
Published |
Weinheim: Wiley-VCH |
Extent |
XXII, 356 S. : Ill., graph. Darst. |
ISBN |
978-3-527-31052-4 |
Language |
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Country |
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Topic |
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Subject |
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Other editions |
Erscheint auch als Online-Ausgabe: Thin Film Analysis by X-Ray Scattering |
Further information |
Literaturangaben |
Record ID |
973333952 |
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