Title |
Charakterisierung von Nanokristallen in Siliziumkarbid mittels Transmissionselektronenmikroskopie / von Johannes Biskupek |
|---|---|
Involved |
Johannes Biskupek (Verfasser) |
Published |
2004 |
Extent |
89 Bl. : Ill., graph. Darst. |
Thesis |
Jena, Univ., Diss., 2004 |
Topic |
|
Subject |
Siliciumcarbid, Ionenimplantation, Nanopartikel, Durchstrahlungselektronenmikroskop, Elektronenholografie |
Record ID |
973514396 |
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