Title |
Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / S. Rein |
|---|---|
Involved |
Stefan Rein (Verfasser) |
Published |
Berlin, heidelberg, New York: Springer |
Extent |
XXVI, 489 S. : graph. Darst. |
ISBN |
978-3-540-25303-7 |
Language |
|
Country |
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Topic |
|
Subject |
Siliciumhalbleiter, Werkstofffehler, Lebensdauerspektroskopie |
Series |
|
Other editions |
Erscheint auch als Online-Ausgabe: Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications |
Further information |
Literaturangaben |
Record ID |
973933135 |
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