Title |
Transmissionselektronenmikroskopische Untersuchungen zur Gitterplatzbesetzung von Dotanden in Siliziumkarbid / von Thomas Kups |
|---|---|
Involved |
Thomas Kups (Verfasser) |
Published |
2006 |
Extent |
96 Bl. : Ill., graph. Darst. |
Thesis |
Jena, Univ., Diss., 2006 |
Topic |
|
Subject |
Siliciumcarbid
Dotierung Fremdatom Durchstrahlungselektronenmikroskopie
Siliciumcarbid
Durchstrahlungselektronenmikroskop Elektronenbeugung |
DDC notation |
|
Record ID |
981098711 |
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