Title |
Transmissionselektronenmikroskopische Untersuchungen zur Gitterplatzbesetzung von Dotanden in Siliziumkarbid / von Thomas Kups |
|---|---|
Involved |
Thomas Kups (Verfasser) |
Published |
2006 |
Extent |
Online-Ressource |
Thesis |
Jena, Univ., Diss., 2006 |
Topic |
|
Subject |
Siliciumcarbid
Durchstrahlungselektronenmikroskop Elektronenbeugung Siliciumcarbid
Dotierung
Fremdatom Durchstrahlungselektronenmikroskopie |
DDC notation |
|
Persistent identifier |
|
Record ID |
982764804 |
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