Title |
A landmark based method for the geometrical 3D calibration of scanning microscopes / Martin Ritter. [Hrsg.: Bundesanstalt für Materialforschung und -prüfung (BAM)] |
|---|---|
Involved |
Martin Ritter (Verfasser) |
Published |
Bremerhaven: Wirtschaftsverl. NW, Verl. für Neue Wiss. |
Extent |
XI, 131 S. : Ill., graph. Darst. |
Thesis |
Zugl.: Berlin, Techn. Univ., Diss., 2006 |
ISBN |
978-3-86509-630-2 |
Language |
|
Country |
|
Topic |
|
Subject |
|
DDC notation |
|
Series |
BAM-Dissertationsreihe ; Bd. 21 |
Record ID |
983506663 |
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