Title |
New horizons of applied scanning electron microscopy / Kenichi Shimizu ; Tomoaki Mitani |
|---|---|
Involved |
Kenichi Shimizu (Verfasser) |
Published |
Berlin, Heidelberg: Springer |
Extent |
XIV, 179 S. : Ill., graph. Darst. |
ISBN |
978-3-642-03159-5 |
Language |
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Country |
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Topic |
|
Subject |
Rasterelektronenmikroskopie, Feldemissionsmikroskopie, Probenvorbereitung, Hochfrequenzsputtern |
DDC notation |
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Series |
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Other editions |
Erscheint auch als Online-Ausgabe: New Horizons of Applied Scanning Electron Microscopy |
Further information |
Literaturangaben |
Record ID |
995947406 |
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